ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.

Furkejuvvon:
Bibliográfalaš dieđut
Searvvušdahkkit: International Symposium for Testing and Failure Analysis Bellevue, Wash., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Materiálatiipa: Elektrovnnalaš Konfereansapublikašuvdna E-girji
Giella:eaŋgalasgiella
Almmustuhtton: Materials Park, OH : ASM International, c2000.
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Liŋkkat:An electronic book accessible through the World Wide Web; click to view
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Geahča maid: ISTFA 2000