ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.

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Detalhes bibliográficos
Corporate Authors:	International Symposium for Testing and Failure Analysis Bellevue, Wash., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Formato:	Recurso Electrónico Conference Proceeding livro electrónico
Idioma:	inglês
Publicado em:	Materials Park, OH : ASM International, c2000.
Assuntos:	Electronics > Materials > Testing > Congresses. Electronic apparatus and appliances > Testing > Congresses. Electronic books.
Acesso em linha:	An electronic book accessible through the World Wide Web; click to view
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