ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.

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Bibliografische gegevens
Coauteurs: International Symposium for Testing and Failure Analysis Bellevue, Wash., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Formaat: Elektronisch Conferentie akten E-boek
Taal:English
Gepubliceerd in: Materials Park, OH : ASM International, c2000.
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Online toegang:An electronic book accessible through the World Wide Web; click to view
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