ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.

Saved in:

Bibliographic Details
Corporate Authors:	International Symposium for Testing and Failure Analysis Bellevue, Wash., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Format:	Electronic Conference Proceeding eBook
Language:	English
Published:	Materials Park, OH : ASM International, c2000.
Subjects:	Electronics > Materials > Testing > Congresses. Electronic apparatus and appliances > Testing > Congresses. Electronic books.
Online Access:	An electronic book accessible through the World Wide Web; click to view
Tags:	Add Tag No Tags, Be the first to tag this record!

Internet