ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California /

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Bibliografische gegevens
Coauteurs:	International Symposium for Testing and Failure Analysis Santa Clara, Calif., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Formaat:	Elektronisch Conferentie akten E-boek
Taal:	Engels
Gepubliceerd in:	Materials Park, Ohio : ASM International, 2003.
Onderwerpen:	Electronics > Materials > Testing > Congresses. Electronic apparatus and appliances > Testing > Congresses. Electronic books.
Online toegang:	An electronic book accessible through the World Wide Web; click to view
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