ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California /

Na minha lista:

Detalhes bibliográficos
Corporate Authors:	International Symposium for Testing and Failure Analysis Santa Clara, Calif., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Formato:	Recurso Electrónico Conference Proceeding livro electrónico
Idioma:	inglês
Publicado em:	Materials Park, Ohio : ASM International, 2003.
Assuntos:	Electronics > Materials > Testing > Congresses. Electronic apparatus and appliances > Testing > Congresses. Electronic books.
Acesso em linha:	An electronic book accessible through the World Wide Web; click to view
Tags:	Adicionar Tag Sem tags, seja o primeiro a adicionar uma tag!

Internet