International Symposium for Testing and Failure Analysis Santa Clara, Calif, ASM International, Electronic Device Failure Analysis Society, & ebrary, Inc. (2003). ISTFA 2003: Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California. ASM International.
Chicago-viite (17. p.)International Symposium for Testing and Failure Analysis Santa Clara, Calif, ASM International, Electronic Device Failure Analysis Society, ja Inc ebrary. ISTFA 2003: Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California. Materials Park, Ohio: ASM International, 2003.
MLA-viite (9. p.)International Symposium for Testing and Failure Analysis Santa Clara, Calif, et al. ISTFA 2003: Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California. ASM International, 2003.