APA(7版)引用形式
International Symposium for Testing and Failure Analysis Santa Clara, Calif, ASM International, Electronic Device Failure Analysis Society, & ebrary, Inc. (2003). ISTFA 2003: Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California. ASM International.
Chicagoスタイル(17版)引用形式
International Symposium for Testing and Failure Analysis Santa Clara, Calif, ASM International, Electronic Device Failure Analysis Society, , Inc ebrary. ISTFA 2003: Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California. Materials Park, Ohio: ASM International, 2003.
MLA(9版)引用形式
International Symposium for Testing and Failure Analysis Santa Clara, Calif, et al. ISTFA 2003: Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California. ASM International, 2003.
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