ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /

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Bibliografske podrobnosti
Corporate Authors: International Symposium for Testing and Failure Analysis Portland, Or., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Format: Elektronski Conference Proceeding eKnjiga
Jezik:angleščina
Izdano: Materials Park, OH : Asm International, c2008.
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Online dostop:An electronic book accessible through the World Wide Web; click to view
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