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ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /

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Furkejuvvon:
Searvvušdahkkit: International Symposium for Testing and Failure Analysis Portland, Or., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Materiálatiipa: Elektrovnnalaš Konfereansapublikašuvdna E-girji
Giella:eaŋgalasgiella
Almmustuhtton: Materials Park, OH : Asm International, c2008.
Fáttát:
Electronics > Materials > Testing > Congresses.
Electronic apparatus and appliances > Testing > Congresses.
Electronic books.
Liŋkkat:An electronic book accessible through the World Wide Web; click to view
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Olgguldas hápmi:xx, 528 p. : ill.
Bibliografiija:Includes bibliographical references and index.

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