ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /

I tiakina i:
Ngā taipitopito rārangi puna kōrero
Ngā kaituhi rangatōpū: International Symposium for Testing and Failure Analysis Portland, Or., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Hōputu: Tāhiko Mauhanga Hui īPukapuka
Reo:Ingarihi
I whakaputaina: Materials Park, OH : Asm International, c2008.
Ngā marau:
Urunga tuihono:An electronic book accessible through the World Wide Web; click to view
Ngā Tūtohu: Tāpirihia he Tūtohu
Kāore He Tūtohu, Me noho koe te mea tuatahi ki te tūtohu i tēnei pūkete!
Whakaahuatanga
Whakaahuatanga ōkiko:xx, 528 p. : ill.
Rārangi puna kōrero:Includes bibliographical references and index.