ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /

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Bibliographic Details
Corporate Authors: International Symposium for Testing and Failure Analysis Portland, Or., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Format: Electronic Conference Proceeding eBook
Language:English
Published: Materials Park, OH : Asm International, c2008.
Subjects:
Online Access:An electronic book accessible through the World Wide Web; click to view
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LEADER 00000nam a2200000Ia 4500
001 0000112302
005 20171002055922.0
006 m u
007 cr cn|||||||||
008 080814s2008 ohua sb 001 0 eng d
020 |z 0871707144 
020 |z 9780871707147 
035 |a (CaPaEBR)ebr10320212 
035 |a (OCoLC)503446669 
040 |a CaPaEBR  |c CaPaEBR 
050 1 4 |a TK7871  |b .I68 2008eb 
111 2 |a International Symposium for Testing and Failure Analysis  |n (34th :  |d 2008 :  |c Portland, Or.) 
245 1 0 |a ISTFA 2008  |h [electronic resource] :  |b conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /  |c sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2008, ASM International. 
246 3 0 |a Proceedings of the 34th International Symposium for Testing and Failure Analysis 
246 3 0 |a 34th International Symposium for Testing and Failure Analysis 
246 3 |a Thirty-fourth International Symposium for Testing and Failure Analysis 
260 |a Materials Park, OH :  |b Asm International,  |c c2008. 
300 |a xx, 528 p. :  |b ill. 
504 |a Includes bibliographical references and index. 
533 |a Electronic reproduction.  |b Palo Alto, Calif. :  |c ebrary,  |d 2009.  |n Available via World Wide Web.  |n Access may be limited to ebrary affiliated libraries. 
650 0 |a Electronics  |x Materials  |x Testing  |v Congresses. 
650 0 |a Electronic apparatus and appliances  |x Testing  |v Congresses. 
655 7 |a Electronic books.  |2 local 
710 2 |a ASM International. 
710 2 |a Electronic Device Failure Analysis Society. 
710 2 |a ebrary, Inc. 
856 4 0 |u http://site.ebrary.com/lib/daystar/Doc?id=10320212  |z An electronic book accessible through the World Wide Web; click to view 
908 |a 170314 
942 0 0 |c EB 
999 |c 101452  |d 101452