ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California /

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Bibliografski detalji
Autori kompanije: International Symposium for Testing and Failure Analysis Santa Clara, Calif., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Format: Elektronički Izvještaj sastanka e-knjiga
Jezik:engleski
Izdano: Materials Park, Ohio : ASM International, 2003.
Teme:
Online pristup:An electronic book accessible through the World Wide Web; click to view
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Opis
Opis fizičkog objekta:518 p. : ill.
Bibliografija:Includes bibliographical references and index.