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ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California /

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Furkejuvvon:
Searvvušdahkkit: International Symposium for Testing and Failure Analysis Santa Clara, Calif., ASM International, ebrary, Inc
Eará dahkkit: Davidson, Grace M.
Materiálatiipa: Elektrovnnalaš Konfereansapublikašuvdna E-girji
Giella:eaŋgalasgiella
Almmustuhtton: Materials Park, OH : ASM International, c1997.
Fáttát:
Electronics > Materials > Testing > Congresses.
Electronic apparatus and appliances > Testing > Congresses.
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