ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California /

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Bibliographic Details
Corporate Authors:	International Symposium for Testing and Failure Analysis Santa Clara, Calif., ASM International, ebrary, Inc
Other Authors:	Davidson, Grace M.
Format:	Electronic Conference Proceeding eBook
Language:	English
Published:	Materials Park, OH : ASM International, c1997.
Subjects:	Electronics > Materials > Testing > Congresses. Electronic apparatus and appliances > Testing > Congresses. Electronic books.
Online Access:	An electronic book accessible through the World Wide Web; click to view
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