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ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California /

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Corporate Authors: International Symposium for Testing and Failure Analysis Santa Clara, Calif., ASM International, ebrary, Inc
Drugi avtorji: Davidson, Grace M.
Format: Elektronski Conference Proceeding eKnjiga
Jezik:angleščina
Izdano: Materials Park, OH : ASM International, c1997.
Teme:
Electronics > Materials > Testing > Congresses.
Electronic apparatus and appliances > Testing > Congresses.
Electronic books.
Online dostop:An electronic book accessible through the World Wide Web; click to view
Oznake: Označite
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Opis knjige/članka:"Manager of Book Production Grace M. Davidson."
Fizični opis:xix, 346 p. : ill.
Bibliografija:Includes bibliographic references and index.

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