ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California /
שמור ב:
| Corporate Authors: | , , |
|---|---|
| מחברים אחרים: | |
| פורמט: | אלקטרוני Conference Proceeding ספר אלקטרוני |
| שפה: | אנגלית |
| יצא לאור: |
Materials Park, OH :
ASM International,
c1997.
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| נושאים: | |
| גישה מקוונת: | An electronic book accessible through the World Wide Web; click to view |
| תגים: |
אין תגיות, היה/י הראשונ/ה לתייג את הרשומה!
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MARC
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| 040 | |a CaPaEBR |c CaPaEBR | ||
| 050 | 1 | 4 | |a TK7871.85 |b .I57775 1997eb |
| 111 | 2 | |a International Symposium for Testing and Failure Analysis |n (23rd : |d 1997 : |c Santa Clara, Calif.) | |
| 245 | 1 | 0 | |a ISTFA '97 |h [electronic resource] : |b proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California / |c sponsored by ASM International. |
| 246 | 3 | |a 23rd international symposium for testing and failure analysis | |
| 260 | |a Materials Park, OH : |b ASM International, |c c1997. | ||
| 300 | |a xix, 346 p. : |b ill. | ||
| 500 | |a "Manager of Book Production Grace M. Davidson." | ||
| 504 | |a Includes bibliographic references and index. | ||
| 533 | |a Electronic reproduction. |b Palo Alto, Calif. : |c ebrary, |d 2009. |n Available via World Wide Web. |n Access may be limited to ebrary affiliated libraries. | ||
| 650 | 0 | |a Electronics |x Materials |x Testing |v Congresses. | |
| 650 | 0 | |a Electronic apparatus and appliances |x Testing |v Congresses. | |
| 655 | 7 | |a Electronic books. |2 local | |
| 700 | 1 | |a Davidson, Grace M. | |
| 710 | 2 | |a ASM International. | |
| 710 | 2 | |a ebrary, Inc. | |
| 856 | 4 | 0 | |u http://site.ebrary.com/lib/daystar/Doc?id=10323496 |z An electronic book accessible through the World Wide Web; click to view |
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