APA (7th ed.) Zitazioa
International Symposium for Testing and Failure Analysis Bellevue, Wash, ASM International, Electronic Device Failure Analysis Society, & ebrary, Inc. (2000). ISTFA 2000: Proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington. ASM International.
Chicago Style (17th ed.) Zitazioa
International Symposium for Testing and Failure Analysis Bellevue, Wash, ASM International, Electronic Device Failure Analysis Society, eta Inc ebrary. ISTFA 2000: Proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington. Materials Park, OH: ASM International, 2000.
MLA (9th ed.) Zitazioa
International Symposium for Testing and Failure Analysis Bellevue, Wash, et al. ISTFA 2000: Proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington. ASM International, 2000.
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