APA-ийн эшлэл(7 дахь хэвлэлт)
International Symposium for Testing and Failure Analysis Bellevue, Wash, ASM International, Electronic Device Failure Analysis Society, & ebrary, Inc. (2000). ISTFA 2000: Proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington. ASM International.
Чикаго-гийн эшлэл (17 дахь хэвлэлт)
International Symposium for Testing and Failure Analysis Bellevue, Wash, ASM International, Electronic Device Failure Analysis Society, ба Inc ebrary. ISTFA 2000: Proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington. Materials Park, OH: ASM International, 2000.
MLA -ийн эшлэл (9 дэх хэвлэлт)
International Symposium for Testing and Failure Analysis Bellevue, Wash, et al. ISTFA 2000: Proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington. ASM International, 2000.
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