Παραπομπή σε μορφή APA (7η εκδ.)
International Symposium for Testing and Failure Analysis Bellevue, Wash, ASM International, Electronic Device Failure Analysis Society, & ebrary, Inc. (2000). ISTFA 2000: Proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington. ASM International.
Παραπομπή σε μορφή Chicago (17η εκδ.)
International Symposium for Testing and Failure Analysis Bellevue, Wash, ASM International, Electronic Device Failure Analysis Society, και Inc ebrary. ISTFA 2000: Proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington. Materials Park, OH: ASM International, 2000.
Παραπομπή σε μορφή MLA (9th εκδ.)
International Symposium for Testing and Failure Analysis Bellevue, Wash, et al. ISTFA 2000: Proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington. ASM International, 2000.
Πρόσοχή: Οι παραπομπές μπορεί να μην είναι 100% ακριβείς.