APA-referens (7:e uppl.)
International Symposium for Testing and Failure Analysis Bellevue, Wash, ASM International, Electronic Device Failure Analysis Society, & ebrary, Inc. (2000). ISTFA 2000: Proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington. ASM International.
Chicago-referens (17:e uppl.)
International Symposium for Testing and Failure Analysis Bellevue, Wash, ASM International, Electronic Device Failure Analysis Society, och Inc ebrary. ISTFA 2000: Proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington. Materials Park, OH: ASM International, 2000.
MLA-referens (9:e uppl.)
International Symposium for Testing and Failure Analysis Bellevue, Wash, et al. ISTFA 2000: Proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington. ASM International, 2000.
Varning: dessa hänvisningar är inte alltid fullständigt riktiga.