ISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts /

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Bibliografische gegevens
Coauteurs:	International Symposium for Testing and Failure Analysis Boston, Mass., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Formaat:	Elektronisch Conferentie akten E-boek
Taal:	Engels
Gepubliceerd in:	Materials Park, OH : ASM International, c2004.
Onderwerpen:	Electronics > Materials > Testing > Congresses. Electronic apparatus and appliances > Testing > Congresses. Electronic books.
Online toegang:	An electronic book accessible through the World Wide Web; click to view
Tags:	Voeg label toe Geen labels, Wees de eerste die dit record labelt!

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