ISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts /

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Bibliografske podrobnosti
Corporate Authors: International Symposium for Testing and Failure Analysis Boston, Mass., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Format: Elektronski Conference Proceeding eKnjiga
Jezik:angleščina
Izdano: Materials Park, OH : ASM International, c2004.
Teme:
Online dostop:An electronic book accessible through the World Wide Web; click to view
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Opis
Fizični opis:[717] p. : ill.
Bibliografija:Includes bibliographical references and index.