ISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts /

I tiakina i:
Ngā taipitopito rārangi puna kōrero
Ngā kaituhi rangatōpū: International Symposium for Testing and Failure Analysis Boston, Mass., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Hōputu: Tāhiko Mauhanga Hui īPukapuka
Reo:Ingarihi
I whakaputaina: Materials Park, OH : ASM International, c2004.
Ngā marau:
Urunga tuihono:An electronic book accessible through the World Wide Web; click to view
Ngā Tūtohu: Tāpirihia he Tūtohu
Kāore He Tūtohu, Me noho koe te mea tuatahi ki te tūtohu i tēnei pūkete!
Whakaahuatanga
Whakaahuatanga ōkiko:[717] p. : ill.
Rārangi puna kōrero:Includes bibliographical references and index.