ISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts /
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Corporate Authors: | , , , |
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Format: | Electronic Conference Proceeding eBook |
Language: | English |
Published: |
Materials Park, OH :
ASM International,
c2004.
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Subjects: | |
Online Access: | An electronic book accessible through the World Wide Web; click to view |
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035 | |a (OCoLC)646827305 | ||
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050 | 1 | 4 | |a TK7871 |b .I68 2004eb |
111 | 2 | |a International Symposium for Testing and Failure Analysis |n (30th : |d 2004 : |c Boston, Mass.) | |
245 | 1 | 0 | |a ISTFA 2004 |h [electronic resource] : |b proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts / |c sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2004, ASTM International. |
260 | |a Materials Park, OH : |b ASM International, |c c2004. | ||
300 | |a [717] p. : |b ill. | ||
504 | |a Includes bibliographical references and index. | ||
533 | |a Electronic reproduction. |b Palo Alto, Calif. : |c ebrary, |d 2009. |n Available via World Wide Web. |n Access may be limited to ebrary affiliated libraries. | ||
650 | 0 | |a Electronics |x Materials |x Testing |v Congresses. | |
650 | 0 | |a Electronic apparatus and appliances |x Testing |v Congresses. | |
655 | 7 | |a Electronic books. |2 local | |
710 | 2 | |a ASM International. | |
710 | 2 | |a Electronic Device Failure Analysis Society. | |
710 | 2 | |a ebrary, Inc. | |
856 | 4 | 0 | |u http://site.ebrary.com/lib/daystar/Doc?id=10328960 |z An electronic book accessible through the World Wide Web; click to view |
908 | |a 170314 | ||
942 | 0 | 0 | |c EB |
999 | |c 101993 |d 101993 |