ISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts /

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Bibliographic Details
Corporate Authors: International Symposium for Testing and Failure Analysis Boston, Mass., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Format: Electronic Conference Proceeding eBook
Language:English
Published: Materials Park, OH : ASM International, c2004.
Subjects:
Online Access:An electronic book accessible through the World Wide Web; click to view
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111 2 |a International Symposium for Testing and Failure Analysis  |n (30th :  |d 2004 :  |c Boston, Mass.) 
245 1 0 |a ISTFA 2004  |h [electronic resource] :  |b proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts /  |c sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2004, ASTM International. 
260 |a Materials Park, OH :  |b ASM International,  |c c2004. 
300 |a [717] p. :  |b ill. 
504 |a Includes bibliographical references and index. 
533 |a Electronic reproduction.  |b Palo Alto, Calif. :  |c ebrary,  |d 2009.  |n Available via World Wide Web.  |n Access may be limited to ebrary affiliated libraries. 
650 0 |a Electronics  |x Materials  |x Testing  |v Congresses. 
650 0 |a Electronic apparatus and appliances  |x Testing  |v Congresses. 
655 7 |a Electronic books.  |2 local 
710 2 |a ASM International. 
710 2 |a Electronic Device Failure Analysis Society. 
710 2 |a ebrary, Inc. 
856 4 0 |u http://site.ebrary.com/lib/daystar/Doc?id=10328960  |z An electronic book accessible through the World Wide Web; click to view 
908 |a 170314 
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999 |c 101993  |d 101993