Tohutoro APA (7th ed.)
International Symposium for Testing and Failure Analysis Boston, Mass, ASM International, Electronic Device Failure Analysis Society, & ebrary, Inc. (2004). ISTFA 2004: Proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts. ASM International.
Tohutoru Kātū Chicago (17th ed.)
International Symposium for Testing and Failure Analysis Boston, Mass, ASM International, Electronic Device Failure Analysis Society, me Inc ebrary. ISTFA 2004: Proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts. Materials Park, OH: ASM International, 2004.
Tohutoro MLA (9th ed.)
International Symposium for Testing and Failure Analysis Boston, Mass, et al. ISTFA 2004: Proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts. ASM International, 2004.
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