ISTFA '96 proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.

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書目詳細資料
Corporate Authors:	International Symposium for Testing and Failure Analysis Los Angeles, Calif., ASM International. Electronic Materials and Processing Division, ebrary, Inc
格式:	電子 Conference Proceeding 電子書
語言:	英语
出版:	Materials Park, Ohio : ASM International, c1996.
主題:	Electronics > Materials > Testing > Congresses. Electronic apparatus and appliances > Testing > Congresses. Electronic books.
在線閱讀:	An electronic book accessible through the World Wide Web; click to view
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