ISTFA '96 proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.

Sábháilte in:
Sonraí bibleagrafaíochta
Údair chorparáideacha: International Symposium for Testing and Failure Analysis Los Angeles, Calif., ASM International. Electronic Materials and Processing Division, ebrary, Inc
Formáid: Leictreonach Imeacht comhdhála Ríomhleabhar
Teanga:Béarla
Foilsithe / Cruthaithe: Materials Park, Ohio : ASM International, c1996.
Ábhair:
Rochtain ar líne:An electronic book accessible through the World Wide Web; click to view
Clibeanna: Cuir clib leis
Níl clibeanna ann, Bí ar an gcéad duine le clib a chur leis an taifead seo!

MARC

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035 |a (CaPaEBR)ebr10323517 
035 |a (OCoLC)646817905 
040 |a CaPaEBR  |c CaPaEBR 
050 1 4 |a TK7871  |b .I58 1996eb 
111 2 |a International Symposium for Testing and Failure Analysis  |n (22nd :  |d 1996 :  |c Los Angeles, Calif.) 
245 1 0 |a ISTFA '96  |h [electronic resource] :  |b proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California. 
260 |a Materials Park, Ohio :  |b ASM International,  |c c1996. 
300 |a xiv, 417 p. :  |b ill. 
533 |a Electronic reproduction.  |b Palo Alto, Calif. :  |c ebrary,  |d 2013.  |n Available via World Wide Web.  |n Access may be limited to ebrary affiliated libraries. 
650 0 |a Electronics  |x Materials  |x Testing  |v Congresses. 
650 0 |a Electronic apparatus and appliances  |x Testing  |v Congresses. 
655 7 |a Electronic books.  |2 local 
710 2 |a ASM International.  |b Electronic Materials and Processing Division. 
710 2 |a ebrary, Inc. 
856 4 0 |u http://site.ebrary.com/lib/daystar/Doc?id=10323517  |z An electronic book accessible through the World Wide Web; click to view 
908 |a 170314 
942 0 0 |c EB 
999 |c 101637  |d 101637