ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA /

Furkejuvvon:
Bibliográfalaš dieđut
Searvvušdahkkit: International Symposium for Testing and Failure Analysis San Jose, Calif., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Materiálatiipa: Elektrovnnalaš Konfereansapublikašuvdna E-girji
Giella:eaŋgalasgiella
Almmustuhtton: Materials Park, Ohio : Asm International, 2009.
Fáttát:
Liŋkkat:An electronic book accessible through the World Wide Web; click to view
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