Cita APA (7th ed.)
International Symposium for Testing and Failure Analysis San Jose, Calif, ASM International, Electronic Device Failure Analysis Society, & ebrary, Inc. (2009). ISTFA 2009: Conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA. Asm International.
Cita Chicago (17th ed.)
International Symposium for Testing and Failure Analysis San Jose, Calif, ASM International, Electronic Device Failure Analysis Society, i Inc ebrary. ISTFA 2009: Conference Proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA. Materials Park, Ohio: Asm International, 2009.
Cita MLA (9th ed.)
International Symposium for Testing and Failure Analysis San Jose, Calif, et al. ISTFA 2009: Conference Proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA. Asm International, 2009.
Atenció: Aquestes cites poden no estar 100% correctes.