ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA /

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Detalles Bibliográficos
Corporate Authors:	International Symposium for Testing and Failure Analysis San Jose, Calif., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Formato:	Electrónico Conference Proceeding eBook
Idioma:	inglés
Publicado:	Materials Park, Ohio : Asm International, 2009.
Subjects:	Electronic apparatus and appliances > Testing > Congresses. Electronics > Materials > Testing > Congresses. Electronic books.
Acceso en liña:	An electronic book accessible through the World Wide Web; click to view
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