ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /

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Bibliographic Details
Corporate Authors:	International Symposium for Testing and Failure Analysis San Jose, Calif., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Format:	Electronic Conference Proceeding eBook
Language:	English
Published:	Materials Park, OH : ASM International, c2007.
Subjects:	Electronics > Materials > Testing > Congresses. Electronic apparatus and appliances > Testing > Congresses. Electronic books.
Online Access:	An electronic book accessible through the World Wide Web; click to view
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