ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /

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Bibliografski detalji
Autori kompanije: International Symposium for Testing and Failure Analysis San Jose, Calif., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Format: Elektronički Izvještaj sastanka e-knjiga
Jezik:engleski
Izdano: Materials Park, OH : ASM International, c2007.
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Online pristup:An electronic book accessible through the World Wide Web; click to view
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