ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /

Shranjeno v:
Bibliografske podrobnosti
Corporate Authors: International Symposium for Testing and Failure Analysis San Jose, Calif., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Format: Elektronski Conference Proceeding eKnjiga
Jezik:English
Izdano: Materials Park, OH : ASM International, c2007.
Teme:
Online dostop:An electronic book accessible through the World Wide Web; click to view
Oznake: Označite
Brez oznak, prvi označite!