ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /
Shranjeno v:
Corporate Authors: | , , , |
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Format: | Elektronski Conference Proceeding eKnjiga |
Jezik: | English |
Izdano: |
Materials Park, OH :
ASM International,
c2007.
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Teme: | |
Online dostop: | An electronic book accessible through the World Wide Web; click to view |
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