ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /

Saved in:
書目詳細資料
Corporate Authors: International Symposium for Testing and Failure Analysis San Jose, Calif., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
格式: 電子 Conference Proceeding 電子書
語言:英语
出版: Materials Park, OH : ASM International, c2007.
主題:
在線閱讀:An electronic book accessible through the World Wide Web; click to view
標簽: 添加標簽
沒有標簽, 成為第一個標記此記錄!
實物特徵
實物描述:xvi, 356 p. : ill.
參考書目:Includes bibliographical references and index.