APA (7th ed.) մեջբերում
International Symposium for Testing and Failure Analysis San Jose, Calif, ASM International, Electronic Device Failure Analysis Society, & ebrary, Inc. (2007). ISTFA 2007: Proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA. ASM International.
Չիկագոյի ոճի (17րդ խմբ.) մեջբերում
International Symposium for Testing and Failure Analysis San Jose, Calif, ASM International, Electronic Device Failure Analysis Society, and Inc ebrary. ISTFA 2007: Proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA. Materials Park, OH: ASM International, 2007.
MLA (9րդ խմբ.) Մեջբերում
International Symposium for Testing and Failure Analysis San Jose, Calif, et al. ISTFA 2007: Proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA. ASM International, 2007.
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