APA ציטוט
International Symposium for Testing and Failure Analysis San Jose, Calif, ASM International, Electronic Device Failure Analysis Society, & ebrary, Inc. (2007). ISTFA 2007: Proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA. ASM International.
Chicago Style (17th ed.) Citation
International Symposium for Testing and Failure Analysis San Jose, Calif, ASM International, Electronic Device Failure Analysis Society, and Inc ebrary. ISTFA 2007: Proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA. Materials Park, OH: ASM International, 2007.
ציטוט MLA
International Symposium for Testing and Failure Analysis San Jose, Calif, et al. ISTFA 2007: Proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA. ASM International, 2007.
אזהרה: ציטוטים אלה לעיתים לא מדויקים ב 100%.