APA način citiranja (7. izdanje)
International Symposium for Testing and Failure Analysis San Jose, Calif, ASM International, Electronic Device Failure Analysis Society, & ebrary, Inc. (2007). ISTFA 2007: Proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA. ASM International.
Čikaški stil citiranja (17. izdanje)
International Symposium for Testing and Failure Analysis San Jose, Calif, ASM International, Electronic Device Failure Analysis Society, i Inc ebrary. ISTFA 2007: Proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA. Materials Park, OH: ASM International, 2007.
MLA način citiranja (9. izdanje)
International Symposium for Testing and Failure Analysis San Jose, Calif, et al. ISTFA 2007: Proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA. ASM International, 2007.
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