ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA /
I tiakina i:
| Ngā kaituhi rangatōpū: | , , , |
|---|---|
| Hōputu: | Tāhiko Mauhanga Hui īPukapuka |
| Reo: | Ingarihi |
| I whakaputaina: |
Materials Park, Ohio :
Asm International,
2009.
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| Ngā marau: | |
| Urunga tuihono: | An electronic book accessible through the World Wide Web; click to view |
| Ngā Tūtohu: |
Kāore He Tūtohu, Me noho koe te mea tuatahi ki te tūtohu i tēnei pūkete!
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| Whakaahuatanga ōkiko: | xvi, 355 p. : ill. |
|---|---|
| Rārangi puna kōrero: | Includes bibliographical references and index. |