ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA /

I tiakina i:
Ngā taipitopito rārangi puna kōrero
Ngā kaituhi rangatōpū: International Symposium for Testing and Failure Analysis San Jose, Calif., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Hōputu: Tāhiko Mauhanga Hui īPukapuka
Reo:Ingarihi
I whakaputaina: Materials Park, Ohio : Asm International, 2009.
Ngā marau:
Urunga tuihono:An electronic book accessible through the World Wide Web; click to view
Ngā Tūtohu: Tāpirihia he Tūtohu
Kāore He Tūtohu, Me noho koe te mea tuatahi ki te tūtohu i tēnei pūkete!
Whakaahuatanga
Whakaahuatanga ōkiko:xvi, 355 p. : ill.
Rārangi puna kōrero:Includes bibliographical references and index.