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ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA /

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Corporate Authors: International Symposium for Testing and Failure Analysis San Jose, Calif., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Format: Elektronski Conference Proceeding eKnjiga
Jezik:angleščina
Izdano: Materials Park, Ohio : Asm International, 2009.
Teme:
Electronic apparatus and appliances > Testing > Congresses.
Electronics > Materials > Testing > Congresses.
Electronic books.
Online dostop:An electronic book accessible through the World Wide Web; click to view
Oznake: Označite
Brez oznak, prvi označite!
Fizični opis:xvi, 355 p. : ill.
Bibliografija:Includes bibliographical references and index.

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