ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA /
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| Corporate Authors: | , , , |
|---|---|
| Format: | Electronic Conference Proceeding eBook |
| Language: | English |
| Published: |
Materials Park, Ohio :
Asm International,
2009.
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| Subjects: | |
| Online Access: | An electronic book accessible through the World Wide Web; click to view |
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| 020 | |z 1615030085 | ||
| 020 | |z 9781615030088 | ||
| 035 | |a (CaPaEBR)ebr10374914 | ||
| 035 | |a (OCoLC)647897132 | ||
| 040 | |a CaPaEBR |c CaPaEBR | ||
| 050 | 1 | 4 | |a TK7871 |b .I58 2009eb |
| 111 | 2 | |a International Symposium for Testing and Failure Analysis |n (35th : |d 2009 : |c San Jose, Calif.) | |
| 245 | 1 | 0 | |a ISTFA 2009 |h [electronic resource] : |b conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA / |c sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International. |
| 260 | |a Materials Park, Ohio : |b Asm International, |c 2009. | ||
| 300 | |a xvi, 355 p. : |b ill. | ||
| 504 | |a Includes bibliographical references and index. | ||
| 533 | |a Electronic reproduction. |b Palo Alto, Calif. : |c ebrary, |d 2010. |n Available via World Wide Web. |n Access may be limited to ebrary affiliated libraries. | ||
| 650 | 0 | |a Electronic apparatus and appliances |x Testing |v Congresses. | |
| 650 | 0 | |a Electronics |x Materials |x Testing |v Congresses. | |
| 655 | 7 | |a Electronic books. |2 local | |
| 710 | 2 | |a ASM International. | |
| 710 | 2 | |a Electronic Device Failure Analysis Society. | |
| 710 | 2 | |a ebrary, Inc. | |
| 856 | 4 | 0 | |u http://site.ebrary.com/lib/daystar/Doc?id=10374914 |z An electronic book accessible through the World Wide Web; click to view |
| 908 | |a 170314 | ||
| 942 | 0 | 0 | |c EB |
| 999 | |c 108181 |d 108181 | ||