APA (7. basım) Alıntı
International Symposium for Testing and Failure Analysis San Jose, Calif, ASM International, Electronic Device Failure Analysis Society, & ebrary, Inc. (2009). ISTFA 2009: Conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA. Asm International.
Chicago Style (17. basım) Atıf
International Symposium for Testing and Failure Analysis San Jose, Calif, ASM International, Electronic Device Failure Analysis Society, ve Inc ebrary. ISTFA 2009: Conference Proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA. Materials Park, Ohio: Asm International, 2009.
MLA (9th ed.) Atıf
International Symposium for Testing and Failure Analysis San Jose, Calif, et al. ISTFA 2009: Conference Proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA. Asm International, 2009.
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