Стиль цитування APA (7-ме видання)
International Symposium for Testing and Failure Analysis San Jose, Calif, ASM International, Electronic Device Failure Analysis Society, & ebrary, Inc. (2009). ISTFA 2009: Conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA. Asm International.
Чикаго стиль цитування (17-те видання)
International Symposium for Testing and Failure Analysis San Jose, Calif, ASM International, Electronic Device Failure Analysis Society, та Inc ebrary. ISTFA 2009: Conference Proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA. Materials Park, Ohio: Asm International, 2009.
Стиль цитування MLA (9-ме видання)
International Symposium for Testing and Failure Analysis San Jose, Calif, et al. ISTFA 2009: Conference Proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA. Asm International, 2009.
Попередження: стилі цитування не завжди правильні на всі 100%.