ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA /

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Bibliografiske detaljer
Corporate Authors: International Symposium for Testing and Failure Analysis San Jose, Calif., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Format: Electronisk Conference Proceeding eBog
Sprog:engelsk
Udgivet: Materials Park, Ohio : Asm International, 2009.
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