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ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California /

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Egile korporatiboa:	International Symposium for Testing and Failure Analysis Santa Clara, Calif., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Formatua:	Baliabide elektronikoa Konferentzia-aktak eBook
Hizkuntza:	ingelesa
Argitaratua:	Materials Park, Ohio : ASM International, 2003.
Gaiak:	Electronics > Materials > Testing > Congresses. Electronic apparatus and appliances > Testing > Congresses. Electronic books.
Sarrera elektronikoa:	An electronic book accessible through the World Wide Web; click to view
Etiketak:	Etiketa erantsi Etiketarik gabe, Izan zaitez lehena erregistro honi etiketa jartzen!

Azala

ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California /

Argitaratua 2003.

An electronic book accessible through the World Wide Web; click to view

Baliabide elektronikoa Konferentzia-aktak eBook