APA引文
International Symposium for Testing and Failure Analysis Santa Clara, Calif, ASM International, Electronic Device Failure Analysis Society, & ebrary, Inc. (2003). ISTFA 2003: Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California. ASM International.
芝加哥风格引文
International Symposium for Testing and Failure Analysis Santa Clara, Calif, ASM International, Electronic Device Failure Analysis Society, 与 Inc ebrary. ISTFA 2003: Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California. Materials Park, Ohio: ASM International, 2003.
MLA引文
International Symposium for Testing and Failure Analysis Santa Clara, Calif, et al. ISTFA 2003: Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California. ASM International, 2003.
警告:这些引文格式不一定是100%准确.