APA-ийн эшлэл(7 дахь хэвлэлт)
International Symposium for Testing and Failure Analysis Santa Clara, Calif, ASM International, Electronic Device Failure Analysis Society, & ebrary, Inc. (2003). ISTFA 2003: Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California. ASM International.
Чикаго-гийн эшлэл (17 дахь хэвлэлт)
International Symposium for Testing and Failure Analysis Santa Clara, Calif, ASM International, Electronic Device Failure Analysis Society, ба Inc ebrary. ISTFA 2003: Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California. Materials Park, Ohio: ASM International, 2003.
MLA -ийн эшлэл (9 дэх хэвлэлт)
International Symposium for Testing and Failure Analysis Santa Clara, Calif, et al. ISTFA 2003: Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California. ASM International, 2003.
Анхааруулга: Эдгээр ишлэлүүд үргэлж 100% үнэн зөв биш байж магадгүй.