International Symposium for Testing and Failure Analysis Santa Clara, Calif, ASM International, Electronic Device Failure Analysis Society, & ebrary, Inc. (2003). ISTFA 2003: Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California. ASM International.
Cóipeáladh chuig an ngearrthaisce go rathúil é
Níorbh fhéidir cóipeáil chuig an ngearrthaisce
Lua i Stíl Chicago (17ú heag.)
International Symposium for Testing and Failure Analysis Santa Clara, Calif, ASM International, Electronic Device Failure Analysis Society, agus Inc ebrary. ISTFA 2003: Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California. Materials Park, Ohio: ASM International, 2003.
Cóipeáladh chuig an ngearrthaisce go rathúil é
Níorbh fhéidir cóipeáil chuig an ngearrthaisce
Lua MLA (9ú heag.)
International Symposium for Testing and Failure Analysis Santa Clara, Calif, et al. ISTFA 2003: Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California. ASM International, 2003.
Cóipeáladh chuig an ngearrthaisce go rathúil é
Níorbh fhéidir cóipeáil chuig an ngearrthaisce
Rabhadh: Seans nach mbeach na luanna seo go hiomlán cruinn i ngach uile chás.