ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California /
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| Corporate Authors: | , , , |
|---|---|
| Format: | Electronic Conference Proceeding eBook |
| Language: | English |
| Published: |
Materials Park, Ohio :
ASM International,
2003.
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| Subjects: | |
| Online Access: | An electronic book accessible through the World Wide Web; click to view |
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| 111 | 2 | |a International Symposium for Testing and Failure Analysis |n (29th : |d 2003 : |c Santa Clara, Calif.) | |
| 245 | 1 | 0 | |a ISTFA 2003 |h [electronic resource] : |b proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California / |c sponsored by EDFAS. |
| 246 | 3 | 0 | |a Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003 |
| 246 | 3 | 4 | |a Conference proceedings from the 29th International Symposium for Testing and Failure Analysis |
| 260 | |a Materials Park, Ohio : |b ASM International, |c 2003. | ||
| 300 | |a 518 p. : |b ill. | ||
| 504 | |a Includes bibliographical references and index. | ||
| 533 | |a Electronic reproduction. |b Palo Alto, Calif. : |c ebrary, |d 2009. |n Available via World Wide Web. |n Access may be limited to ebrary affiliated libraries. | ||
| 650 | 0 | |a Electronics |x Materials |x Testing |v Congresses. | |
| 650 | 0 | |a Electronic apparatus and appliances |x Testing |v Congresses. | |
| 655 | 7 | |a Electronic books. |2 local | |
| 710 | 2 | |a ASM International. | |
| 710 | 2 | |a Electronic Device Failure Analysis Society. | |
| 710 | 2 | |a ebrary, Inc. | |
| 856 | 4 | 0 | |u http://site.ebrary.com/lib/daystar/Doc?id=10328966 |z An electronic book accessible through the World Wide Web; click to view |
| 908 | |a 170314 | ||
| 942 | 0 | 0 | |c EB |
| 999 | |c 101999 |d 101999 | ||