कवर छवि

क्यूआर कोड

Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films /

में बचाया:

ग्रंथसूची विवरण
मुख्य लेखक:	Wolstenholme, John (लेखक)
स्वरूप:	इलेक्ट्रोनिक ई-पुस्तक
भाषा:	अंग्रेज़ी
प्रकाशित:	New York, [New York] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2015.
श्रृंखला:	Materials characterization and analysis collection.
विषय:	Auger electron spectroscopy. analytical methods Auger electron spectroscopy (AES) Auger spectrometers chemical imaging depth profiling energy analyzer interface analysis materials analysis microanalysis nanoanalysis scanning Auger microscopy (SAM) secondary electron microscopy spectrometer surface analysis surface sensitive surface specific thin film analysis ultrahigh vacuum
ऑनलाइन पहुंच:	An electronic book accessible through the World Wide Web; click to view
टैग:	टैग जोड़ें कोई टैग नहीं, इस रिकॉर्ड को टैग करने वाले पहले व्यक्ति बनें!

कवर छवि

Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films / द्वारा Wolstenholme, John

प्रकाशित 2015.

An electronic book accessible through the World Wide Web; click to view

इलेक्ट्रोनिक ई-पुस्तक