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Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films /

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Bibliografski detalji
Glavni autor:	Wolstenholme, John (Autor)
Format:	Elektronički e-knjiga
Jezik:	engleski
Izdano:	New York, [New York] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2015.
Serija:	Materials characterization and analysis collection.
Teme:	Auger electron spectroscopy. analytical methods Auger electron spectroscopy (AES) Auger spectrometers chemical imaging depth profiling energy analyzer interface analysis materials analysis microanalysis nanoanalysis scanning Auger microscopy (SAM) secondary electron microscopy spectrometer surface analysis surface sensitive surface specific thin film analysis ultrahigh vacuum
Online pristup:	An electronic book accessible through the World Wide Web; click to view
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Slika omota

Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films / od Wolstenholme, John

Izdano 2015

An electronic book accessible through the World Wide Web; click to view

Elektronički e-knjiga