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Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films /

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Bibliographische Detailangaben
1. Verfasser:	Wolstenholme, John (Verfasst von)
Format:	Elektronisch E-Book
Sprache:	Englisch
Veröffentlicht:	New York, [New York] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2015.
Schriftenreihe:	Materials characterization and analysis collection.
Schlagworte:	Auger electron spectroscopy. analytical methods Auger electron spectroscopy (AES) Auger spectrometers chemical imaging depth profiling energy analyzer interface analysis materials analysis microanalysis nanoanalysis scanning Auger microscopy (SAM) secondary electron microscopy spectrometer surface analysis surface sensitive surface specific thin film analysis ultrahigh vacuum
Online-Zugang:	An electronic book accessible through the World Wide Web; click to view
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Buchumschlag

Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films / von Wolstenholme, John

Veröffentlicht 2015

An electronic book accessible through the World Wide Web; click to view

Elektronisch E-Book