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Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films /

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书目详细资料
主要作者:	Wolstenholme, John (Author)
格式:	电子电子书
语言:	英语
出版:	New York, [New York] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2015.
丛编:	Materials characterization and analysis collection.
主题:	Auger electron spectroscopy. analytical methods Auger electron spectroscopy (AES) Auger spectrometers chemical imaging depth profiling energy analyzer interface analysis materials analysis microanalysis nanoanalysis scanning Auger microscopy (SAM) secondary electron microscopy spectrometer surface analysis surface sensitive surface specific thin film analysis ultrahigh vacuum
在线阅读:	An electronic book accessible through the World Wide Web; click to view
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Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films / 由 Wolstenholme, John

出版 2015

An electronic book accessible through the World Wide Web; click to view

电子电子书