Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films /

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Detalles Bibliográficos
Autor principal:	Wolstenholme, John (Autor)
Formato:	Electrónico eBook
Lenguaje:	inglés
Publicado:	New York, [New York] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2015.
Colección:	Materials characterization and analysis collection.
Materias:	Auger electron spectroscopy. analytical methods Auger electron spectroscopy (AES) Auger spectrometers chemical imaging depth profiling energy analyzer interface analysis materials analysis microanalysis nanoanalysis scanning Auger microscopy (SAM) secondary electron microscopy spectrometer surface analysis surface sensitive surface specific thin film analysis ultrahigh vacuum
Acceso en línea:	An electronic book accessible through the World Wide Web; click to view
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