Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films /

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Dades bibliogràfiques
Autor principal: Wolstenholme, John (Autor)
Format: Electrònic eBook
Idioma:anglès
Publicat: New York, [New York] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2015.
Col·lecció:Materials characterization and analysis collection.
Matèries:
Accés en línia:An electronic book accessible through the World Wide Web; click to view
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Taula de continguts:
  • 1. Introduction
  • 2. The interaction of electrons with solid materials
  • 3. AES methodologies
  • 4. Instrumentation for auger analysis
  • 5. Auger electron spectroscopy in materials analysis
  • 6. Analytical methods for the characterization of materials
  • Appendix 1. Abbreviations and acronyms
  • Appendix 2. Quantum numbers
  • Appendix 3. Comparison of surface and thin film analysis techniques
  • Appendix 4. Standardization in surface analysis
  • Appendix 5. Sources of the figures
  • Further reading
  • Index.