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Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films /

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Salvato in:
Dettagli Bibliografici
Autore principale: Wolstenholme, John (Autore)
Natura: Elettronico eBook
Lingua:inglese
Pubblicazione: New York, [New York] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2015.
Serie:Materials characterization and analysis collection.
Soggetti:
Auger electron spectroscopy.
analytical methods
Auger electron spectroscopy (AES)
Auger spectrometers
chemical imaging
depth profiling
energy analyzer
interface analysis
materials analysis
microanalysis
nanoanalysis
scanning Auger microscopy (SAM)
secondary electron microscopy
spectrometer
surface analysis
surface sensitive
surface specific
thin film analysis
ultrahigh vacuum
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Sommario:
  • 1. Introduction
  • 2. The interaction of electrons with solid materials
  • 3. AES methodologies
  • 4. Instrumentation for auger analysis
  • 5. Auger electron spectroscopy in materials analysis
  • 6. Analytical methods for the characterization of materials
  • Appendix 1. Abbreviations and acronyms
  • Appendix 2. Quantum numbers
  • Appendix 3. Comparison of surface and thin film analysis techniques
  • Appendix 4. Standardization in surface analysis
  • Appendix 5. Sources of the figures
  • Further reading
  • Index.

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