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Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films /

Wedi'i Gadw mewn:
Prif Awdur: Wolstenholme, John (Awdur)
Fformat: Electronig eLyfr
Iaith:Saesneg
Cyhoeddwyd: New York, [New York] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2015.
Cyfres:Materials characterization and analysis collection.
Pynciau:
Auger electron spectroscopy.
analytical methods
Auger electron spectroscopy (AES)
Auger spectrometers
chemical imaging
depth profiling
energy analyzer
interface analysis
materials analysis
microanalysis
nanoanalysis
scanning Auger microscopy (SAM)
secondary electron microscopy
spectrometer
surface analysis
surface sensitive
surface specific
thin film analysis
ultrahigh vacuum
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