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Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films /

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Xehetasun bibliografikoak
Egile nagusia:	Wolstenholme, John (Egilea)
Formatua:	Baliabide elektronikoa eBook
Hizkuntza:	ingelesa
Argitaratua:	New York, [New York] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2015.
Saila:	Materials characterization and analysis collection.
Gaiak:	Auger electron spectroscopy. analytical methods Auger electron spectroscopy (AES) Auger spectrometers chemical imaging depth profiling energy analyzer interface analysis materials analysis microanalysis nanoanalysis scanning Auger microscopy (SAM) secondary electron microscopy spectrometer surface analysis surface sensitive surface specific thin film analysis ultrahigh vacuum
Sarrera elektronikoa:	An electronic book accessible through the World Wide Web; click to view
Etiketak:	Etiketa erantsi Etiketarik gabe, Izan zaitez lehena erregistro honi etiketa jartzen!

Azala

Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films / nork Wolstenholme, John

Argitaratua 2015

An electronic book accessible through the World Wide Web; click to view

Baliabide elektronikoa eBook