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Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films /

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書目詳細資料
主要作者:	Wolstenholme, John (Author)
格式:	電子電子書
語言:	英语
出版:	New York, [New York] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2015.
叢編:	Materials characterization and analysis collection.
主題:	Auger electron spectroscopy. analytical methods Auger electron spectroscopy (AES) Auger spectrometers chemical imaging depth profiling energy analyzer interface analysis materials analysis microanalysis nanoanalysis scanning Auger microscopy (SAM) secondary electron microscopy spectrometer surface analysis surface sensitive surface specific thin film analysis ultrahigh vacuum
在線閱讀:	An electronic book accessible through the World Wide Web; click to view
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Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films / 由 Wolstenholme, John

出版 2015

An electronic book accessible through the World Wide Web; click to view

電子電子書