Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan /

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Bibliografski detalji
Autor kompanije: International Conference on Defects: Recognition, Imaging and Physics in Semiconductors Miyazaki-shi, Japan
Daljnji autori: Yamada-Kaneta, Hiroshi, Sakai, Akira (Professor of engineering science)
Format: Elektronički Izvještaj sastanka e-knjiga
Jezik:engleski
Izdano: Durnten-Zurich ; Enfield, NH : Trans Tech Publications, [2012]
Serija:Materials science forum ; v. 725.
Teme:
Online pristup:An electronic book accessible through the World Wide Web; click to view
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