Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan /

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Bibliographic Details
Corporate Author: International Conference on Defects: Recognition, Imaging and Physics in Semiconductors Miyazaki-shi, Japan
Other Authors: Yamada-Kaneta, Hiroshi, Sakai, Akira (Professor of engineering science)
Format: Electronic Conference Proceeding eBook
Language:English
Published: Durnten-Zurich ; Enfield, NH : Trans Tech Publications, [2012]
Series:Materials science forum ; v. 725.
Subjects:
Online Access:An electronic book accessible through the World Wide Web; click to view
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245 1 0 |a Defects-recognition, imaging and physics in semiconductors XIV :  |b selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan /  |c edited by Hiroshi Yamada-Kaneta and Akira Sakai. 
264 1 |a Durnten-Zurich ;  |a Enfield, NH :  |b Trans Tech Publications,  |c [2012] 
264 4 |c ©2012 
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336 |a text  |2 rdacontent 
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490 1 |a Materials science forum ;  |v vol. 725 
588 |a Description based on online resource; title from PDF title page (ebrary, viewed October 31, 2013). 
590 |a Electronic reproduction. Palo Alto, Calif. : ebrary, 2013. Available via World Wide Web. Access may be limited to ebrary affiliated libraries. 
650 0 |a Semiconductors  |x Defects  |v Congresses. 
650 0 |a Physics  |v Congresses. 
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700 1 |a Yamada-Kaneta, Hiroshi. 
700 1 |a Sakai, Akira  |c (Professor of engineering science) 
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830 0 |a Materials science forum ;  |v v. 725. 
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