Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan /
Wedi'i Gadw mewn:
Awdur Corfforaethol: | |
---|---|
Awduron Eraill: | , |
Fformat: | Electronig Trafodyn Cynhadledd eLyfr |
Iaith: | Saesneg |
Cyhoeddwyd: |
Durnten-Zurich ; Enfield, NH :
Trans Tech Publications,
[2012]
|
Cyfres: | Materials science forum ;
v. 725. |
Pynciau: | |
Mynediad Ar-lein: | An electronic book accessible through the World Wide Web; click to view |
Tagiau: |
Ychwanegu Tag
Dim Tagiau, Byddwch y cyntaf i dagio'r cofnod hwn!
|