Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan /

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Detaylı Bibliyografya
Müşterek Yazar: International Conference on Defects: Recognition, Imaging and Physics in Semiconductors Miyazaki-shi, Japan
Diğer Yazarlar: Yamada-Kaneta, Hiroshi, Sakai, Akira (Professor of engineering science)
Materyal Türü: Elektronik Konferans Sunumu Ekitap
Dil:İngilizce
Baskı/Yayın Bilgisi: Durnten-Zurich ; Enfield, NH : Trans Tech Publications, [2012]
Seri Bilgileri:Materials science forum ; v. 725.
Konular:
Online Erişim:An electronic book accessible through the World Wide Web; click to view
Etiketler: Etiketle
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Diğer Bilgiler
Fiziksel Özellikler:1 online resource (300 pages).
ISBN:9783038138563 (ebook)