Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan /
Furkejuvvon:
| Searvvušdahkki: | |
|---|---|
| Eará dahkkit: | , |
| Materiálatiipa: | Elektrovnnalaš Konfereansapublikašuvdna E-girji |
| Giella: | eaŋgalasgiella |
| Almmustuhtton: |
Durnten-Zurich ; Enfield, NH :
Trans Tech Publications,
[2012]
|
| Ráidu: | Materials science forum ;
v. 725. |
| Fáttát: | |
| Liŋkkat: | An electronic book accessible through the World Wide Web; click to view |
| Fáddágilkorat: |
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Geahča maid: Defects-recognition, imaging and physics in semiconductors XIV :
- Defects and diffusion in semiconductors.
- Defects and diffusion in semiconductors. an annual retrospective /
- Defects and diffusion in semiconductors XIII /
- Defects and diffusion, theory and simulation : an annual retrospective II /
- Defects and diffusion, theory and simulation : an annual retrospective I /
- Electron paramagnetic resonance studies of point defects in AlGaN and SiC /