Semiconductor strain metrology principles and applications /
Uloženo v:
| Hlavní autor: | |
|---|---|
| Korporativní autor: | |
| Médium: | Elektronický zdroj E-kniha |
| Jazyk: | angličtina |
| Vydáno: |
[Saif Zone, Sharjah, U.A.E] ; Oak Park, IL :
Bentham Science,
[2012]
|
| Témata: | |
| On-line přístup: | An electronic book accessible through the World Wide Web; click to view |
| Tagy: |
Žádné tagy, Buďte první, kdo vytvoří štítek k tomuto záznamu!
|
Podobné jednotky: Semiconductor strain metrology
- Nanoscaled semiconductor-on-insulator materials, sensors and devices : selected, peer reviewed papers from the 6th International Workshop on Semiconductor-on-Insulator Materials and Devices, 24-28 October, 2010 Kyiv, Ukraine /
- An introduction to the physics and electrochemistry of semiconductors : fundamentals and applications /
- Materials for high-temperature semiconductor devices
- Nitride semiconductor devices fundamentals and applications /
- Handbook of wafer bonding
- Recent topics on modeling of semiconductor processes, devices, and circuits