Semiconductor strain metrology principles and applications /

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Bibliographic Details
Main Author: Wong, Terence K. S.
Corporate Author: ebrary, Inc
Format: Electronic eBook
Language:English
Published: [Saif Zone, Sharjah, U.A.E] ; Oak Park, IL : Bentham Science, [2012]
Subjects:
Online Access:An electronic book accessible through the World Wide Web; click to view
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020 |z 9781608053599 
035 |a (CaPaEBR)ebr10570978 
035 |a (OCoLC)811371628 
040 |a CaPaEBR  |c CaPaEBR 
050 1 4 |a TK7871.85  |b .W65 2012eb 
100 1 |a Wong, Terence K. S. 
245 1 0 |a Semiconductor strain metrology  |h [electronic resource] :  |b principles and applications /  |c Terence K.S. Wong. 
260 |a [Saif Zone, Sharjah, U.A.E] ;  |a Oak Park, IL :  |b Bentham Science,  |c [2012] 
300 |a 136 p. :  |b ill. 
504 |a Includes bibliographical references and index. 
533 |a Electronic reproduction.  |b Palo Alto, Calif. :  |c ebrary,  |d 2011.  |n Available via World Wide Web.  |n Access may be limited to ebrary affiliated libraries. 
650 0 |a Semiconductors  |x Design and construction  |x Materials. 
650 0 |a Compound semiconductors  |x Design and construction  |x Materials. 
650 0 |a Silicon-on-insulator technology. 
655 7 |a Electronic books.  |2 local 
710 2 |a ebrary, Inc. 
856 4 0 |u http://site.ebrary.com/lib/daystar/Doc?id=10570978  |z An electronic book accessible through the World Wide Web; click to view 
908 |a 170314 
942 0 0 |c EB 
999 |c 139299  |d 139299