Semiconductor strain metrology principles and applications /
Sábháilte in:
| Príomhchruthaitheoir: | |
|---|---|
| Údar corparáideach: | |
| Formáid: | Leictreonach Ríomhleabhar |
| Teanga: | Béarla |
| Foilsithe / Cruthaithe: |
[Saif Zone, Sharjah, U.A.E] ; Oak Park, IL :
Bentham Science,
[2012]
|
| Ábhair: | |
| Rochtain ar líne: | An electronic book accessible through the World Wide Web; click to view |
| Clibeanna: |
Cuir clib leis
Níl clibeanna ann, Bí ar an gcéad duine le clib a chur leis an taifead seo!
|
| Cur síos fisiciúil: | 136 p. : ill. |
|---|---|
| Leabharliosta: | Includes bibliographical references and index. |